Diffraction line broadening analysis if broadening is caused by both dislocations and limited crystallite size
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Diffraction Line Broadening Analysis if Broadening Is Caused by Both Dislocations and Limited Crystallite Size
The determination of dislocation distribution parameters is discussed for specimens where both strain broadening caused by dislocations and size broadening occur. If the strain broadening is well described by a model due to Wilkens, several methods are possible for the analysis of the broadening of diffraction lines. In sputter deposited nickel layers, three different methods for diffraction li...
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Numerous experiments have shown that strain broadening caused by dislocations can be well described by a special logarithmic series expansion of the Fourier coefficients of Bragg reflection peak profiles. In the present work it will be shown that this formalism can be incorporated into the classical methods of Williamson-Hall and Warren-Averbach. The new procedures are suggested to be called mo...
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Diffraction-line broadening routes are briefly reviewed. Both laboratory and synchrotron xray measurements of W and MgO showed that a Voigt function satisfactorily fits the physically broadened line profiles. The consequences of an assumed Voigt-function profile shape for both sizebroadened and strain-broadened profiles (“double-Voigt” method) are studied. It is shown that the relationship betw...
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It is shown that the random electric fields of charged dislocations in insulators should cause appreciable broadening of sharp resonance lines such as spin-resonance signals. The degree of broadening is very sensitive to the screening of the dislocations by charged point defects. Since the shape of the inhomogeneously broadened resonance line monitors the distribution of the internal fields, th...
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Diffraction line broadening analysis has been proved to be an extremely powerful method to study the defect properties of crystalline materials, since different types of defects produce different types of diffraction line profiles. In other word, the distribution of intensity, especially in tails of line profile, strongly depends on the crystallite size and dislocation structures. In this paper...
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ژورنال
عنوان ژورنال: Journal of Research of the National Institute of Standards and Technology
سال: 2004
ISSN: 1044-677X
DOI: 10.6028/jres.109.005